In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.

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Thu, 05 Nov 2026 04:30:00 +0000

Type Values Removed Values Added
Title Memory Corruption via Improper Input Validation in Exynos ENN NeuralNetworks HAL Leading to Denial of Service

Thu, 05 Nov 2026 02:45:00 +0000

Type Values Removed Values Added
Description In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.
Weaknesses CWE-787
References

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cve-icon MITRE

Status: PUBLISHED

Assigner: samsungsemiconductor

Published:

Updated: 2026-11-05T02:40:30.369Z

Reserved: 2026-08-03T06:35:58.536Z

Link: CVE-2026-68991

cve-icon Vulnrichment

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cve-icon NVD

Status : Received

Published: 2026-11-05T03:17:31.520

Modified: 2026-11-05T03:17:31.520

Link: CVE-2026-68991

cve-icon Redhat

No data.

cve-icon OpenCVE Enrichment

Updated: 2026-11-05T04:15:05Z

Weaknesses